Binocular Compound 4X 10X 40X 100X Inverted Phase Contrast Microscope Illuminated Microscope Microscope Fisher Sixty Microscope Bausch Lomb Stereo Zoom 4 Teaching Microscope National Microscope Ao Stereo Bausch Lomb Stereozoom 4 Microscope 4X 10X 40X 100X Stereozoom 4 Binocular Compound Microscope Meiji Stereo Microscope Microscope Wf10x Swift Stereo Microscope With Illuminated Bausch Lomb Stereozoom 4 Microscope Leica Stereo Zoom 100X Objectives Stereozoom 4 Microscope Metallurgical Microscope Leica Stereozoom Ken A Vision Binocular Laboratory Microscope 2000 Microscope Microscope 30X Leica Stereo Microscope Olympus Stereo Microscope 0X Microscope Vision Engineering Mantis Microscope Olympus Bh-2 Fisher Scientific Microscope Microscope 0 7X Meiji Techno Microscope 10X 43X Microscope With Extras Vision Engineering Mantis Stereozoom Microscope Head Stereo Zoom 4 Binocular Stereo Microscope Stereo Microscope Boom Digital Usb Microscope Bausch Lomb Stereozoom 7 Stereo Zoom 4 Microscope Microscope For Parts Or Repair Bausch Lomb Stereo Zoom 7 Microscope Nikon Stereo Microscope Stereo Microscope Head Leitz Laborlux Bausch Lomb Stereo Zoom 4 Microscope Carl Zeiss Standard Zeiss Standard Microscope 10X 43X Microscope 2000 Celestron Microscope Microscope Led Microscope System Stereo Zoom Microscope Head Micromaster Microscope Stereo Zoom Microscope 0 5 Objectives Olympus Ch Microscope Olympus Ch Nikon Labophot-2 Microscope 10X 20X 40X Olympus Tokyo Microscope Bausch Lomb Binocular Microscope Spencer Binocular Lens Pol Nikon Smz-1 Nikon Labophot 2 Spencer Binocular Microscope Unitron Microscope Usb Digital Microscope Microscope 10X 20X Olympus Phase Contrast Microscope Polarizing Microscope Zeiss Standard Nikon Alphaphot Leitz Orthoplan Microscope Leitz Orthoplan Scanning Electron Microscope Microscope Body Measuring Microscope Olympus Tokyo Professional Microscope 10X 20X Standard Microscope Biological Microscope Usb Microscope Microscope Trinocular Head Zeiss Axiovert Olympus Binocular Bausch Lomb Binocular M20 Microscope Microscope 1X Nikon Labophot Microscope 2 Objectives Stereo Star Zoom Zeiss Binocular Microscope Olympus Microscope Bx Trinocular Head Nikon Eclipse Microscope Lomb Monocular Bausch Lomb Stereozoom School Microscope Microscope Head 0 Meiji Techno Emz-5 Microscope Wf 10X Nikon Diaphot Olympus Sz Microscope Olympus Bh2 Emz-5 Stereo Zoom Microscope Spencer Stereo Nikon Smz Fluorescence Microscope Meiji Techno Emz-5 Olympus Bx 0 7X 3X Bausch Lomb Stereo Zoom Research Microscope 4X 10X 20X Meiji Emz Vision Engineering Zeiss Phase Ao Spencer Microscope Olympus Bh Microscope Olympus Ch2 Southern Precision Leica Dm Bausch Lomb Stereozoom 7 Microscope Zeiss Lomo 569 Microscope Fisher Scientific Micromaster Dynascope Stereo Star Emz-5 Stereo Zoom Metallurgical Microscope Dual Objective Lenses Nikon Optiphot Microscope 0 7X 3 0X Universal Microscope Objective 4X 10X Nikon Labophot Microscope Binocular Head Ao Spencer Labophot 5X 10X Stereo Microscope 10X Board Card Philips Em410 Electron Microscope Circuit Board Card Philips Em410 Electron Microscope 4X 10X 40X Stereo Star Zoom Microscope Student Compound Microscope Usb Microscope Camera Amscope Plan 10X Zoom Range Bausch Lomb Stereo Microscope Olympus Bh Lw Scientific Rathenow Row Zeiss Lomo Lens 2 Eyepieces Olympus Sz Binocular Microscope 4X 10X 40X Olympus Sz40 Olympus Sz30 3 Objectives Microscope Mikroskop 160 0 17 Microscope Objective Olympus Sz3060 Bausch Lomb 0 Nikon Eclipse Lomb 0 Microscope W 4 Objective Microscope With 4 Objective Carl Zeiss Jena Objective Industrial Microscope Inspection Microscope Stereo Zoom Binocular Celestron Digital Microscope Swift Instruments 0 17 Microscope Objective Olympus Bh-2 Bhtu Binocular Head 4X 10X 40X Bausch And Lomb Stereo Zoom Olympus Bh-2 Bhtu Microscope Microscope 15X 10X 0 25 Video Microscope Microscope 2X
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$
329.00
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Condition: Used
Location: Singapore
MN # Model: part taken from JEOL JSM-5200 Scanning Electron Microscope. Unit taken from JEOL JSM-5200 System. for part. This unit is given DOA after received. ... moreDOA Strictly start after received, No extension will be considered.
$
559.00
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Condition: Used
Location: Johnstown, United States
$
212.49
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Condition: Used
Location: Kennewick, United States
$
1150.00
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Condition: Used
Location: Johnstown, United States
Removed from electron scanning microscope. Serial No. 05120097.
$
1440.49
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Condition: Used
Location: Baton Rouge, United States
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$
177.38
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Condition: Used
Location: Kennewick, United States
This item has been fully tested by our tech department and is in good working condition. Item is guaranteed non-DOA and is covered under our 30-Day return ... morepolicy. Item comes to you exactly as pictured -nothing more, nothing less. 102017-DD4A.
$
318.25
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$25.00 Shipping
Condition: Used
Location: Baton Rouge, United States
"The sale of this item may be subject to regulation by the U.S. Food and Drug Administration and state and local regulatory agencies. For all others, ... morethere will be extra. We acquired the unit in a state surplus sale.
$
69.99
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$11.99 Shipping
Condition: Used
Location: Rolla, United States
Jeol PRH1 CSI-2 M682KL Scanning Electron Microscope Camera. Condition is "Used". Shipped with FedEx Ground or FedEx Home Delivery.Used condition without ... moreoriginal packaging. 57 K
$
499.95
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Condition: Used
Location: Washington, United States
$
1407.13
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Condition: Used
Location: Albuquerque, United States
The physical condition is good, but there are signs of previous use and handling. Part No: Light Pipe. Inventory # 17756.
$
152.99
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Condition: Used
Location: Leander, United States
Manufacturer: Jeol. Lab & Test. this part has minor scuffs and scratches from normal use and shows no major defects that would affect functionality. Notes:This ... morepart was not tested. Se habla espanol!
$
319.00
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$220.00 Shipping
Condition: Used
Location: Singapore
6297B1/eBox/eR10/L1 JEOL JSM-5200 Scanning Electron Microscope Part Inner Part w Yokogawa SM-E6,Used#6297. MN # Model: part taken from JEOL JSM-5200 Scanning ... moreElectron Microscope. Unit taken from JEOL JSM-5200 System.
$
300.00
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Condition: Used
Location: Oxnard, United States
$
36.39
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Condition: New
Location: China
Video output connector: VGA. White balance mode: primary white balance/manual/auto. Signal to Noise Ratio: 45dB. Shutter type: Electronic shutter. LED ... moreRing Light x 1. Power Adapter x 1. Black and white: Yes.
$
435.07
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Condition: New
Location: Ind-estate S.O, India
EXPOSURE 109s ~ 3000ms, Sensitivity 1.76V/Lux-sec Spectral Range (nm) 380nm ~ 650nm (with infrared filter) SNR 38.5dB Dynamic Range 67.7dB. Give us a ... moreshot and we will make sure that you will look to us again!
$
40.62
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Condition: New
Location: China
$
113.86
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$6.90 Shipping
Condition: New – Open box
Location: China
1 x 8MP Digital Eyepiece. Application: Microscope imaging, General image acquisition, macro imaging, etc. Image Sensor: SONY 1/2.3" Color IMX377 CMOS ... moreImage sensor. It can Show the live image directly on any VGA monitor or Projector.
$
75.00
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$18.40 Shipping
Condition: Used
Location: Boulder Creek, United States
The Jeol JSM-840F FEG SEM is equipped with a Field Emission Gun (FEG) that produces an electron beam of outstanding brightness and stability. This enables ... morehighly detailed and high-resolution imaging of samples with exceptional clarity and accuracy.
$
1543.97
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$399.00 Shipping
Condition: Used
Location: United Arab Emirates
EDAX EDS Detector scanning electron microscope. EDAX EDS Detector. Thermo 4463A-1NUS-SN Thermo electron corporation. working pull from laser scanning ... moreelectron microscope. Industrial Single Board Computers.
$
160.00
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$45.00 Shipping
Condition: Used
Location: Israel
Scanning Electron Microscope.
$
619.74
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Condition: Used
Location: Baton Rouge, United States
For all others, there might extra.
$
3182.49
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$195.00 Shipping
Condition: Used
Location: Baton Rouge, United States
We acquired the system in a state surplus sale. We don't have its prior usage history.
$
519.24
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Condition: Used
Location: Baton Rouge, United States
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$
4510.19
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Condition: Used
Location: Albuquerque, United States
The physical condition is good, but there are signs of previous use and handling. Part No: PW 6831/00. Model No: NC 9432 068 31001.
$
512.19
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Condition: Used
Location: Albuquerque, United States
Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous ... moreuse and handling. Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System.
$
50000.00
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Condition: Used
Location: United States
Includes everything pictured including the 2 computers with software pre-loaded with software discs, USB Authentication Dongle, manuals, pump, Oxford ... moreDetector and whatever seen in the pictures. This item has not been altered in any way that changes the performance or safety specifications of the device.
$
47.32
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Condition: New
Location: China
If you are interested in this product, just have a try! C mouth eyepiece interface (), designed for the microscope. The under mouth is the 23.2mm, 30mm ... moreand 30.5mm straight inserted. High- USB2.0 interface, to 480Mb / s.
$
74.86
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$3.00 Shipping
Condition: New
Location: China
The microscope displayed in the picture is not included. - Scan mode: progressive scan. - 1 x USB Line. - Wide Application: Used for education, research, ... morelaboratory, demonstration, maintenance and inspection, etc.
$
50.24
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Condition: New
Location: China
If you are interested in this product, just have a try! C mouth eyepiece interface (), designed for the microscope. The under mouth is the 23.2mm, 30mm ... moreand 30.5mm straight inserted. High-speed USB2.0 interface, up to 480Mb / s.
$
25.58
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Condition: New
Location: China
Item type: Electron Microscope. 1 Electron Microscope. USB interface, get rid of cable trouble. Field angle: 16°(It depends on the lens). 1 USB cable. ... moreHow to download APP Storage humidity: 10-80%RH.
$
57.32
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Condition: New
Location: China
Feature: 1. Interface: USB2.0. 1 x USB Cable. Video Format: AVI. Picture Format: JPEG, BMP. If you do not receive our reply within 48 hours, pls. If you ... moreare satisfied with our service, pls.
$
38.91
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Condition: New
Location: China
This USB microscope has high-speed USB2.0 interface, up to 480Mb/s, giving you a better experience. More widely used in various fields of microscope and ... moreimaging acquisition of various occasions. 1 Microscope.
$
485.87
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$5.00 Shipping
Condition: New
Location: China
It is specially designed with various lighting devices, LED adjustable circular light source, and fluorescent circular light source. - 1 x Set of Base ... moreand Adjustable Bracket. - Lens interface: C/CS interface.
$
921.24
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Condition: Used
Location: Baton Rouge, United States
For all others, there might extra.
$
653.24
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$35.00 Shipping
Condition: Used
Location: Baton Rouge, United States
For all others, there might extra.
$
249.00
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$161.00 Shipping
Condition: Used
Location: Singapore
6298B1/eBox/eR10/L1 JEOL JSM-5200 Scanning Electron Microscope Part Inner Part w 2hose+Yokogawa SM-E6,Used#6298. MN # Model: part taken from JEOL JSM-5200 ... moreScanning Electron Microscope. Unit taken from JEOL JSM-5200 System.
$
750.00
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Condition: Used
Location: Oxnard, United States
$
5011.19
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Condition: Used
Location: Albuquerque, United States
The physical condition is good, but there are signs of previous use and handling. Part No: SEM Column Detector Assembly. Serial numbers or country of ... moremanufacture may vary.
$
73.08
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Condition: Used
Location: Kennewick, United States
$
73.80
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Condition: New
Location: China
$
1172.49
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$225.00 Shipping
Condition: Used
Location: Baton Rouge, United States
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$
35.90
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Condition: New
Location: China
Brightness, contrast, saturation, sharpness and gamma software adjustable;. High-resolution image sensor, high-quality color reproduction, high definition;. ... more1x USB cable. 1x 23.2 mm to 30 mm adapter ring.
$
549.99
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$114.33 Shipping
Condition: Used
Location: Morgan Hill, United States
This ITEM isUSED. · A subset of the primary functions of the device that an ordinary user of the device expects to function are verified working through ... moremanual or software tests. · Hardware required for key functions to be tested may have been removed after testing (e.g. Hard Drive).
$
854.24
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Condition: Used
Location: Baton Rouge, United States
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$
19.98
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Condition: Used
Location: Phoenix, United States
This item is used. The date of publication is unknown.
$
1010.19
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Condition: Used
Location: Albuquerque, United States
Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous ... moreuse and handling. Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System.
$
35.90
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Condition: New
Location: China
Brightness, contrast, saturation, sharpness and gamma software adjustable;. High-resolution image sensor, high-quality color reproduction, high definition;. ... more1x USB cable. 1x 23.2 mm to 30 mm adapter ring.
$
1005.22
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Condition: Used
Location: Albuquerque, United States
Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope System. This JEOL JSM-6300F SEM Cold Cathode Gauge Panel is used working surplus. The physical ... morecondition is good, but there are signs of previous use and handling.
$
1002.19
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Condition: Used
Location: Albuquerque, United States
This JEOL AP002106(01) Processor Board PCB Card INTER FACE(1)PB JSM-6400F is used working surplus. The physical condition is good, but there are signs ... moreof previous use and handling. Part No: AP002106(01).
$
707.13
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Condition: Used
Location: Albuquerque, United States
This JEOL Small Column Detector Assembly JWS-2000 Wafer Defect Review SEM is used working surplus. Removed from a JEOL JWS-2000 Wafer Defect Review SEM ... moreScanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling.
$
1011.19
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Condition: Used
Location: Albuquerque, United States
The physical condition is good, but there are signs of previous use and handling. Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron ... moreMicroscope System. Serial numbers or country of manufacture may vary.
$
292.29
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$18.27 Shipping
Condition: New
Location: Canada
$
499.99
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$73.16 Shipping
Condition: For parts or not working
Location: Pleasant Plains, United States
U get everything in the photos. Cords cut
$
1995.00
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Condition: Used
Location: Mountainair, United States
This unit was sitting under a vacuum chamber of a scanning electron microscope as part of a system to minimize vibration of the sample being inspected. ... moreThere were 3 air isolation units under the 3 mounts shown above.
$
854.24
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Condition: Used
Location: Baton Rouge, United States
For all others, there might extra.
$
1005.22
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Condition: Used
Location: Albuquerque, United States
Part No: AP002179. The physical condition is good, but there are signs of previous use and handling. Compatible with JEOL JSM-6300F / JSM-6400F SEM Scanning ... moreElectron Microscopes. Serial numbers or country of manufacture may vary.
$
971.49
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$174.00 Shipping
Condition: Used
Location: Baton Rouge, United States
For all others, there might extra.
$
811.19
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Condition: Used
Location: Albuquerque, United States
This JEOL PMT Assembly BP101955-00 SEI Preamp BP101526(01) JWS-7555S is used working surplus. The physical condition is good, but there are signs of previous ... moreuse and handling. PCB Part No: BP101526(01), SEI PREAMP PB.
$
38.55
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Condition: New
Location: China
This USB microscope has high- USB2.0 interface, to 480Mb/s, giving you a better experience. More widely used in various fields of microscope and imaging ... moreacquisition of various occasions. 1 Microscope.
$
60.39
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Condition: New
Location: China
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