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$220.00 Shipping Condition: Used Location: Singapore MN # Model: part taken from JEOL JSM-5200 Scanning Electron Microscope. Unit taken from JEOL JSM-5200 System. for part. This unit is given DOA after received. ... moreDOA Strictly start after received, No extension will be considered.
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$75.43 Shipping Condition: Used Location: Johnstown, United States
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Free Shipping Condition: Used Location: Kennewick, United States
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$70.25 Shipping Condition: Used Location: Johnstown, United States Removed from electron scanning microscope. Serial No. 05120097.
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$265.00 Shipping Condition: Used Location: Baton Rouge, United States For all others, there might extra.
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Free Shipping Condition: Used Location: Kennewick, United States This item has been fully tested by our tech department and is in good working condition. Item is guaranteed non-DOA and is covered under our 30-Day return ... morepolicy. Item comes to you exactly as pictured -nothing more, nothing less. 102017-DD4A.
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$25.00 Shipping Condition: Used Location: Baton Rouge, United States "The sale of this item may be subject to regulation by the U.S. Food and Drug Administration and state and local regulatory agencies. For all others, ... morethere will be extra. We acquired the unit in a state surplus sale.
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$11.99 Shipping Condition: Used Location: Rolla, United States Jeol PRH1 CSI-2 M682KL Scanning Electron Microscope Camera. Condition is "Used". Shipped with FedEx Ground or FedEx Home Delivery.Used condition without ... moreoriginal packaging. 57 K
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$42.61 Shipping Condition: Used Location: Washington, United States
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Free Shipping Condition: Used Location: Albuquerque, United States The physical condition is good, but there are signs of previous use and handling. Part No: Light Pipe. Inventory # 17756.
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Free Shipping Condition: Used Location: Leander, United States Manufacturer: Jeol. Lab & Test. this part has minor scuffs and scratches from normal use and shows no major defects that would affect functionality. Notes:This ... morepart was not tested. Se habla espanol!
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$220.00 Shipping Condition: Used Location: Singapore 6297B1/eBox/eR10/L1 JEOL JSM-5200 Scanning Electron Microscope Part Inner Part w Yokogawa SM-E6,Used#6297. MN # Model: part taken from JEOL JSM-5200 Scanning ... moreElectron Microscope. Unit taken from JEOL JSM-5200 System.
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Free Shipping Condition: Used Location: Oxnard, United States
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Free Shipping Condition: New Location: China Video output connector: VGA. White balance mode: primary white balance/manual/auto. Signal to Noise Ratio: 45dB. Shutter type: Electronic shutter. LED ... moreRing Light x 1. Power Adapter x 1. Black and white: Yes.
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Free Shipping Condition: New Location: Ind-estate S.O, India EXPOSURE 109s ~ 3000ms, Sensitivity 1.76V/Lux-sec Spectral Range (nm) 380nm ~ 650nm (with infrared filter) SNR 38.5dB Dynamic Range 67.7dB. Give us a ... moreshot and we will make sure that you will look to us again!
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$5.85 Shipping Condition: New Location: China
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$6.90 Shipping Condition: New – Open box Location: China 1 x 8MP Digital Eyepiece. Application: Microscope imaging, General image acquisition, macro imaging, etc. Image Sensor: SONY 1/2.3" Color IMX377 CMOS ... moreImage sensor. It can Show the live image directly on any VGA monitor or Projector.
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$18.40 Shipping Condition: Used Location: Boulder Creek, United States The Jeol JSM-840F FEG SEM is equipped with a Field Emission Gun (FEG) that produces an electron beam of outstanding brightness and stability. This enables ... morehighly detailed and high-resolution imaging of samples with exceptional clarity and accuracy.
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$399.00 Shipping Condition: Used Location: United Arab Emirates EDAX EDS Detector scanning electron microscope. EDAX EDS Detector. Thermo 4463A-1NUS-SN Thermo electron corporation. working pull from laser scanning ... moreelectron microscope. Industrial Single Board Computers.
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$45.00 Shipping Condition: Used Location: Israel Scanning Electron Microscope.
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$95.00 Shipping Condition: Used Location: Baton Rouge, United States For all others, there might extra.
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$195.00 Shipping Condition: Used Location: Baton Rouge, United States We acquired the system in a state surplus sale. We don't have its prior usage history.
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$55.00 Shipping Condition: Used Location: Baton Rouge, United States For all others, there might extra.
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Free Shipping Condition: Used Location: Albuquerque, United States The physical condition is good, but there are signs of previous use and handling. Part No: PW 6831/00. Model No: NC 9432 068 31001.
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Free Shipping Condition: Used Location: Albuquerque, United States Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous ... moreuse and handling. Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System.
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$1500.00 Shipping Condition: Used Location: United States Includes everything pictured including the 2 computers with software pre-loaded with software discs, USB Authentication Dongle, manuals, pump, Oxford ... moreDetector and whatever seen in the pictures. This item has not been altered in any way that changes the performance or safety specifications of the device.
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Free Shipping Condition: New Location: China If you are interested in this product, just have a try! C mouth eyepiece interface (), designed for the microscope. The under mouth is the 23.2mm, 30mm ... moreand 30.5mm straight inserted. High- USB2.0 interface, to 480Mb / s.
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$3.00 Shipping Condition: New Location: China The microscope displayed in the picture is not included. - Scan mode: progressive scan. - 1 x USB Line. - Wide Application: Used for education, research, ... morelaboratory, demonstration, maintenance and inspection, etc.
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Free Shipping Condition: New Location: China If you are interested in this product, just have a try! C mouth eyepiece interface (), designed for the microscope. The under mouth is the 23.2mm, 30mm ... moreand 30.5mm straight inserted. High-speed USB2.0 interface, up to 480Mb / s.
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Free Shipping Condition: New Location: China Item type: Electron Microscope. 1 Electron Microscope. USB interface, get rid of cable trouble. Field angle: 16°(It depends on the lens). 1 USB cable. ... moreHow to download APP Storage humidity: 10-80%RH.
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Free Shipping Condition: New Location: China Feature: 1. Interface: USB2.0. 1 x USB Cable. Video Format: AVI. Picture Format: JPEG, BMP. If you do not receive our reply within 48 hours, pls. If you ... moreare satisfied with our service, pls.
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Free Shipping Condition: New Location: China This USB microscope has high-speed USB2.0 interface, up to 480Mb/s, giving you a better experience. More widely used in various fields of microscope and ... moreimaging acquisition of various occasions. 1 Microscope.
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$5.00 Shipping Condition: New Location: China It is specially designed with various lighting devices, LED adjustable circular light source, and fluorescent circular light source. - 1 x Set of Base ... moreand Adjustable Bracket. - Lens interface: C/CS interface.
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$95.00 Shipping Condition: Used Location: Baton Rouge, United States For all others, there might extra.
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$35.00 Shipping Condition: Used Location: Baton Rouge, United States For all others, there might extra.
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$161.00 Shipping Condition: Used Location: Singapore 6298B1/eBox/eR10/L1 JEOL JSM-5200 Scanning Electron Microscope Part Inner Part w 2hose+Yokogawa SM-E6,Used#6298. MN # Model: part taken from JEOL JSM-5200 ... moreScanning Electron Microscope. Unit taken from JEOL JSM-5200 System.
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Free Shipping Condition: Used Location: Oxnard, United States
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Free Shipping Condition: Used Location: Albuquerque, United States The physical condition is good, but there are signs of previous use and handling. Part No: SEM Column Detector Assembly. Serial numbers or country of ... moremanufacture may vary.
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Free Shipping Condition: Used Location: Kennewick, United States
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$5.84 Shipping Condition: New Location: China
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$225.00 Shipping Condition: Used Location: Baton Rouge, United States For all others, there might extra.
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Free Shipping Condition: New Location: China Brightness, contrast, saturation, sharpness and gamma software adjustable;. High-resolution image sensor, high-quality color reproduction, high definition;. ... more1x USB cable. 1x 23.2 mm to 30 mm adapter ring.
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$114.33 Shipping Condition: Used Location: Morgan Hill, United States This ITEM isUSED. · A subset of the primary functions of the device that an ordinary user of the device expects to function are verified working through ... moremanual or software tests. · Hardware required for key functions to be tested may have been removed after testing (e.g. Hard Drive).
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$45.00 Shipping Condition: Used Location: Baton Rouge, United States For all others, there might extra.
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$8.82 Shipping Condition: Used Location: Phoenix, United States This item is used. The date of publication is unknown.
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Free Shipping Condition: Used Location: Albuquerque, United States Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous ... moreuse and handling. Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System.
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Free Shipping Condition: New Location: China Brightness, contrast, saturation, sharpness and gamma software adjustable;. High-resolution image sensor, high-quality color reproduction, high definition;. ... more1x USB cable. 1x 23.2 mm to 30 mm adapter ring.
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Free Shipping Condition: Used Location: Albuquerque, United States Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope System. This JEOL JSM-6300F SEM Cold Cathode Gauge Panel is used working surplus. The physical ... morecondition is good, but there are signs of previous use and handling.
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Free Shipping Condition: Used Location: Albuquerque, United States This JEOL AP002106(01) Processor Board PCB Card INTER FACE(1)PB JSM-6400F is used working surplus. The physical condition is good, but there are signs ... moreof previous use and handling. Part No: AP002106(01).
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Free Shipping Condition: Used Location: Albuquerque, United States This JEOL Small Column Detector Assembly JWS-2000 Wafer Defect Review SEM is used working surplus. Removed from a JEOL JWS-2000 Wafer Defect Review SEM ... moreScanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling.
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Free Shipping Condition: Used Location: Albuquerque, United States The physical condition is good, but there are signs of previous use and handling. Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron ... moreMicroscope System. Serial numbers or country of manufacture may vary.
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$18.27 Shipping Condition: New Location: Canada
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$73.16 Shipping Condition: For parts or not working Location: Pleasant Plains, United States U get everything in the photos. Cords cut
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Condition: Used Location: Mountainair, United States This unit was sitting under a vacuum chamber of a scanning electron microscope as part of a system to minimize vibration of the sample being inspected. ... moreThere were 3 air isolation units under the 3 mounts shown above.
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$35.00 Shipping Condition: Used Location: Baton Rouge, United States For all others, there might extra.
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Free Shipping Condition: Used Location: Albuquerque, United States Part No: AP002179. The physical condition is good, but there are signs of previous use and handling. Compatible with JEOL JSM-6300F / JSM-6400F SEM Scanning ... moreElectron Microscopes. Serial numbers or country of manufacture may vary.
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$174.00 Shipping Condition: Used Location: Baton Rouge, United States For all others, there might extra.
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Free Shipping Condition: Used Location: Albuquerque, United States This JEOL PMT Assembly BP101955-00 SEI Preamp BP101526(01) JWS-7555S is used working surplus. The physical condition is good, but there are signs of previous ... moreuse and handling. PCB Part No: BP101526(01), SEI PREAMP PB.
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Free Shipping Condition: New Location: China This USB microscope has high- USB2.0 interface, to 480Mb/s, giving you a better experience. More widely used in various fields of microscope and imaging ... moreacquisition of various occasions. 1 Microscope.
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Free Shipping Condition: New Location: China
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